Unraveling the μτ-mystery in a-Si:H

Homer Antoniadis, E. A. Schiff

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The μτ-mystery is the large difference between mobility-lifetime products (μτ) in a-Si:H estimated from steady-state photoconductivity and transient photocharge measurements. We discuss whether this effect can be attributed to deep-trapping of electrons and subsequent re-emission prior to recombination. We present a simplified version of the re-emission model which shows that its principal assumptions can be checked using photocharge measurements over a sufficiently large time range. Measurements of the transient photocharge in a-Si:H are presented between 10-8 and 102 s; the measurements show the same features as the re-emission model, and permit the characteristic emission time to be measured.

Original languageEnglish (US)
Pages (from-to)435-438
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume137-138
Issue numberPART 1
DOIs
StatePublished - 1991

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Unraveling the μτ-mystery in a-Si:H'. Together they form a unique fingerprint.

  • Cite this