Unraveling the μτ-mystery in a-Si: H

Homer Antoniadis, Eric Allan Schiff

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The μτ-mystery is the large difference between mobility-lifetime products (μτ) in a-Si:H estimated from steady-state photoconductivity and transient photocharge measurements. We discuss whether this effect can be attributed to deep-trapping of electrons and subsequent re-emission prior to recombination. We present a simplified version of the re-emission model which shows that its principal assumptions can be checked using photocharge measurements over a sufficiently large time range. Measurements of the transient photocharge in a-Si:H are presented between 10-8 and 102 s; the measurements show the same features as the re-emission model, and permit the characteristic emission time to be measured.

Original languageEnglish (US)
Pages (from-to)435-438
Number of pages4
JournalJournal of Non-Crystalline Solids
Volume137-138
Issue numberPART 1
DOIs
StatePublished - 1991

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Photoconductivity
photoconductivity
trapping
life (durability)
Electrons
products
electrons

ASJC Scopus subject areas

  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials

Cite this

Unraveling the μτ-mystery in a-Si : H. / Antoniadis, Homer; Schiff, Eric Allan.

In: Journal of Non-Crystalline Solids, Vol. 137-138, No. PART 1, 1991, p. 435-438.

Research output: Contribution to journalArticle

Antoniadis, Homer ; Schiff, Eric Allan. / Unraveling the μτ-mystery in a-Si : H. In: Journal of Non-Crystalline Solids. 1991 ; Vol. 137-138, No. PART 1. pp. 435-438.
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