The Unified-FFT algorithm for fast electromagnetic analysis of planar integrated circuits printed on layered media inside a rectangular enclosure

The unified fast Fourier transform (UFFT) methodology is proposed for fast method of moments analysis of dense integrated circuits embedded in layered media inside perfectly electric conducting or perfectly magnetic conducting enclosures of rectangular cross section. The pre-corrected fast Fourier transform (FFT) method is modified to handle the dyadic Green's function (DGF) of shielded layered media through factorization of the DGF into four convolution/correlation terms enabling fast matrix solve operations (MSOs). Calculation of the impedance matrix elements in the form of an infinite series of waveguide modes is cast into the form of a 2-D discrete Fourier transform allowing for fast FFT-accelerated matrix fill operations (MFOs). Fast FFT-enhanced MSOs and MFOs used in conjunction form the UFFT method. The computational complexity and memory requirements for the proposed UFFT solver scale as O(N\log N) and O(N), respectively, where $N$ is the number of unknowns in the discrete approximation of the governing integral equation. New criteria specific to shielded circuits for the projection of the current expansion functions on a uniform FFT grid are developed. The accuracy and efficiency of the solver is demonstrated through its application to multiple examples of full-wave analysis of large planar circuits.