Susceptibility of on-chip protection circuits to latent failures caused by electrostatic discharges

P. S. Neelakantaswamy, R. I. Turkman, Tapan Kumar Sarkar

Research output: Contribution to journalArticle

2 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)677-679
Number of pages3
JournalSolid State Electronics
Volume29
Issue number6
DOIs
StatePublished - 1986
Externally publishedYes

Fingerprint

Electrostatic discharge
MOS devices
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Susceptibility of on-chip protection circuits to latent failures caused by electrostatic discharges. / Neelakantaswamy, P. S.; Turkman, R. I.; Sarkar, Tapan Kumar.

In: Solid State Electronics, Vol. 29, No. 6, 1986, p. 677-679.

Research output: Contribution to journalArticle

Neelakantaswamy, P. S. ; Turkman, R. I. ; Sarkar, Tapan Kumar. / Susceptibility of on-chip protection circuits to latent failures caused by electrostatic discharges. In: Solid State Electronics. 1986 ; Vol. 29, No. 6. pp. 677-679.
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