Susceptibility of on-chip protection circuits to latent failures caused by electrostatic discharges

P. S. Neelakantaswamy, R. I. Turkman, T. K. Sarkar

Research output: Contribution to journalArticle

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)677-679
Number of pages3
JournalSolid State Electronics
Volume29
Issue number6
DOIs
StatePublished - Jun 1986

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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