Abstract
The authors observe how the errors in location of the elements of a two-dimensional antenna array affect the gain pattern of the array in a statistical manner. A procedure for deriving the expectation and variance of the two-dimensional array pattern when the array uses Tseng window weight for its gain at each element is presented. By computing the expectation, variance, and deviation of the array pattern, the critical value for the position error can be determined depending on the desired sidelobe level of the array. Numerical results are presented.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE Antennas and Propagation Society, AP-S International Symposium (Digest) |
| Editors | Anon |
| Publisher | IEEE Computer Society |
| Pages | 408-411 |
| Number of pages | 4 |
| Volume | 1 |
| State | Published - 1989 |
| Event | International Symposium Digest - Antennas and Propagation - 1989 - San Jose, CA, USA Duration: Jun 26 1989 → Jun 30 1989 |
Other
| Other | International Symposium Digest - Antennas and Propagation - 1989 |
|---|---|
| City | San Jose, CA, USA |
| Period | 6/26/89 → 6/30/89 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering