Stability of dangling bonds in amorphous hydrogenated silicon

Sufi Zafar, E. A. Schiff

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Optical bias (illumination intensity) and Staebler-Wronski (illumination history) effects on the paramagnetic defects (dangling bonds) in undoped amorphous hydrogenated silicon are investigated using absorption mode electron spin resonance (ESR). The change in the ESR signature (spectrum and spin relaxation) while under illumination is compared with the absence of significant signature changes in the dark spectrum even following a substantial illumination-induced increase in the defect density.

Original languageEnglish (US)
Pages (from-to)239-242
Number of pages4
JournalThin Solid Films
Volume164
Issue numberC
DOIs
StatePublished - Oct 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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