Signal coupling to embedded pitch adapters in silicon sensors

M. Artuso; C. Betancourt; I. Bezshyiko; S. Blusk; R. Bruendler; S. Bugiel; R. Dasgupta; A. Dendek; B. Dey; S. Ely; F. Lionetto; M. Petruzzo; I. Polyakov; M. Rudolph; H. Schindler; O. Steinkamp; S. Stone

doi:10.1016/j.nima.2017.09.039

Signal coupling to embedded pitch adapters in silicon sensors

M. Artuso, C. Betancourt, I. Bezshyiko, S. Blusk, R. Bruendler, S. Bugiel, R. Dasgupta, A. Dendek, B. Dey, S. Ely, F. Lionetto, M. Petruzzo, I. Polyakov, M. Rudolph, H. Schindler, O. Steinkamp, S. Stone

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.

Original language	English (US)
Pages (from-to)	252-258
Number of pages	7
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	877
DOIs	https://doi.org/10.1016/j.nima.2017.09.039
State	Published - Jan 1 2018

Keywords

Detector technology
Pitch adapters
Sensor irradiation
Silicon sensors
Testbeam

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

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10.1016/j.nima.2017.09.039

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Artuso, M., Betancourt, C., Bezshyiko, I., Blusk, S., Bruendler, R., Bugiel, S., Dasgupta, R., Dendek, A., Dey, B., Ely, S., Lionetto, F., Petruzzo, M., Polyakov, I., Rudolph, M., Schindler, H., Steinkamp, O., & Stone, S. (2018). Signal coupling to embedded pitch adapters in silicon sensors. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 877, 252-258. https://doi.org/10.1016/j.nima.2017.09.039

Artuso, M, Betancourt, C, Bezshyiko, I, Blusk, S, Bruendler, R, Bugiel, S, Dasgupta, R, Dendek, A, Dey, B, Ely, S, Lionetto, F, Petruzzo, M, Polyakov, I, Rudolph, M, Schindler, H, Steinkamp, O & Stone, S 2018, 'Signal coupling to embedded pitch adapters in silicon sensors', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 877, pp. 252-258. https://doi.org/10.1016/j.nima.2017.09.039

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abstract = "We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.",

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doi = "10.1016/j.nima.2017.09.039",

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AU - Artuso, M.

AU - Betancourt, C.

AU - Bezshyiko, I.

AU - Blusk, S.

AU - Bruendler, R.

AU - Bugiel, S.

AU - Dasgupta, R.

AU - Dendek, A.

AU - Dey, B.

AU - Ely, S.

AU - Lionetto, F.

AU - Petruzzo, M.

AU - Polyakov, I.

AU - Rudolph, M.

AU - Schindler, H.

AU - Steinkamp, O.

AU - Stone, S.

PY - 2018/1/1

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N2 - We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.

AB - We have examined the effects of embedded pitch adapters on signal formation in n-substrate silicon microstrip sensors with data from beam tests and simulation. According to simulation, the presence of the pitch adapter metal layer changes the electric field inside the sensor, resulting in slowed signal formation on the nearby strips and a pick-up effect on the pitch adapter. This can result in an inefficiency to detect particles passing through the pitch adapter region. All these effects have been observed in the beam test data.

KW - Detector technology

KW - Pitch adapters

KW - Sensor irradiation

KW - Silicon sensors

KW - Testbeam

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JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Signal coupling to embedded pitch adapters in silicon sensors

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Keywords

ASJC Scopus subject areas

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