A variety of techniques for the design and implementation of highly reliable electronic systems has been developed. However, these systems need to be tested frequently for possible faults in order to maintain high reliability. In many cases, in addition to the detection of faults, it is necessary to locate them also. In this paper, we consider the problem of designing efficient experiments for the location of faults in modular systems. Abstract only.
|Original language||English (US)|
|Number of pages||1|
|State||Published - Dec 1 1982|
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