Semi-analytical current source modeling of near-threshold operating logic cells considering process variations

Qing Xie, Tiansong Cui, Yanzhi Wang, Shahin Nazarian, Massoud Pedram

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

Operating circuits in the ultra-low voltage regime results in significantly lower power consumption but can also degrade the circuit performance. In addition, it leads to higher sensitivity to various sources of variability in VLSI circuits. This paper extends the current source modeling (CSM) technique, which has successfully been applied to VLSI circuits to achieve very high accuracy in timing analysis, to the near-threshold voltage regime. In particular, it shows how to combine non-linear analytical models and low-dimensionality CSM lookup tables to simultaneously achieve modeling accuracy, space and time efficiency, when performing CSM-based timing analysis of VLSI circuits operating in near-threshold regime and subject to process variability effects.

Original languageEnglish (US)
Title of host publication2013 IEEE 31st International Conference on Computer Design, ICCD 2013
PublisherIEEE Computer Society
Pages447-450
Number of pages4
ISBN (Print)9781479929870
DOIs
StatePublished - Jan 1 2013
Event2013 IEEE 31st International Conference on Computer Design, ICCD 2013 - Asheville, NC, United States
Duration: Oct 6 2013Oct 9 2013

Publication series

Name2013 IEEE 31st International Conference on Computer Design, ICCD 2013

Other

Other2013 IEEE 31st International Conference on Computer Design, ICCD 2013
CountryUnited States
CityAsheville, NC
Period10/6/1310/9/13

Keywords

  • current-source modeling
  • near-threshold computing
  • process variation
  • statistical timing analysis

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Hardware and Architecture

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    Xie, Q., Cui, T., Wang, Y., Nazarian, S., & Pedram, M. (2013). Semi-analytical current source modeling of near-threshold operating logic cells considering process variations. In 2013 IEEE 31st International Conference on Computer Design, ICCD 2013 (pp. 447-450). [6657079] (2013 IEEE 31st International Conference on Computer Design, ICCD 2013). IEEE Computer Society. https://doi.org/10.1109/ICCD.2013.6657079