Abstract
Joint histogram of two images is required to uniquely determine the mutual information between the two images. It has been pointed out that, under certain conditions, existing joint histogram estimation algorithms like partial volume interpolation (PVI) and linear interpolation may result in different types of artifact patterns in the MI based registration function by introducing spurious maxima. As a result, the artifacts may hamper the global optimization process and limit registration accuracy. In this paper we present an extensive study of interpolation-induced artifacts using simulated brain images and show that similar artifact patterns also exist when other intensity interpolation algorithms like cubic convolution interpolation and cubic B-spline interpolation are used. A new joint histogram estimation scheme named generalized partial volume estimation (GPVE) is proposed to eliminate the artifacts. A kernel function is involved in the proposed scheme and when the 1st order B-spline is chosen as the kernel function, it is equivalent to the PVI. A clinical brain image database furnished by Vanderbilt University is used to compare the accuracy of our algorithm with that of PVI. Our experimental results show that the use of higher order kernels can effectively remove the artifacts and, in cases when MI based registration result suffers from the artifacts, registration accuracy can be improved significantly.
Original language | English (US) |
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Pages (from-to) | 122-133 |
Number of pages | 12 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4731 |
DOIs | |
State | Published - 2002 |
Event | Sensor Fusion: Architectures, Algorithms, and Applications VI - Orlando, FL, United States Duration: Apr 3 2002 → Apr 5 2002 |
Keywords
- Interpolation-induced artifacts
- Joint histogram estimation
- Multimodality image registration
- Mutual information based image registration
- Registration of brain images
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering