Real-time embedded system support for the BTeV level 1 muon trigger

Michael J. Haney; D. Beauregard; R. Iyer; Z. Kalbarczyk; Q. Liu; L. Wang; M. Haney; M. Selen; D. Mosse; O. Shigiltchoff; R. Chopade; L. Hovey; M. Jung; D. Messie; J. Oh; S. Stone; T. Bapty; S. Neema; S. Nordstrom; S. Shetty; S. Vashishtha; D. Yao; P. Sheldon; E. Vaandering; J. Butler; E. Gottschalk; J. Kowalkowski; M. Votava; J. Appel

Real-time embedded system support for the BTeV level 1 muon trigger

Michael J. Haney, D. Beauregard, R. Iyer, Z. Kalbarczyk, Q. Liu, L. Wang, M. Haney, M. Selen, D. Mosse, O. Shigiltchoff, R. Chopade, L. Hovey, M. Jung, D. Messie, J. Oh, S. Stone, T. Bapty, S. Neema, S. Nordstrom, S. ShettyS. Vashishtha, D. Yao, P. Sheldon, E. Vaandering, J. Butler, E. Gottschalk, J. Kowalkowski, M. Votava, J. Appel

Research output: Contribution to journal › Conference Article › peer-review

Abstract

The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To insure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent multi-university research program for reliable, self-aware, fault adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.

Original language	English (US)
Article number	N36-65
Pages (from-to)	1295-1298
Number of pages	4
Journal	IEEE Nuclear Science Symposium Conference Record
Volume	2
State	Published - 2003
Event	2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference - Portland, OR, United States Duration: Oct 19 2003 → Oct 25 2003

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

Cite this

Haney, M. J., Beauregard, D., Iyer, R., Kalbarczyk, Z., Liu, Q., Wang, L., Haney, M., Selen, M., Mosse, D., Shigiltchoff, O., Chopade, R., Hovey, L., Jung, M., Messie, D., Oh, J., Stone, S., Bapty, T., Neema, S., Nordstrom, S., ... Appel, J. (2003). Real-time embedded system support for the BTeV level 1 muon trigger. IEEE Nuclear Science Symposium Conference Record, 2, 1295-1298. Article N36-65.

Haney, MJ, Beauregard, D, Iyer, R, Kalbarczyk, Z, Liu, Q, Wang, L, Haney, M, Selen, M, Mosse, D, Shigiltchoff, O, Chopade, R, Hovey, L, Jung, M, Messie, D, Oh, J, Stone, S, Bapty, T, Neema, S, Nordstrom, S, Shetty, S, Vashishtha, S, Yao, D, Sheldon, P, Vaandering, E, Butler, J, Gottschalk, E, Kowalkowski, J, Votava, M & Appel, J 2003, 'Real-time embedded system support for the BTeV level 1 muon trigger', IEEE Nuclear Science Symposium Conference Record, vol. 2, N36-65, pp. 1295-1298.

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abstract = "The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To insure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent multi-university research program for reliable, self-aware, fault adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.",

author = "Haney, {Michael J.} and D. Beauregard and R. Iyer and Z. Kalbarczyk and Q. Liu and L. Wang and M. Haney and M. Selen and D. Mosse and O. Shigiltchoff and R. Chopade and L. Hovey and M. Jung and D. Messie and J. Oh and S. Stone and T. Bapty and S. Neema and S. Nordstrom and S. Shetty and S. Vashishtha and D. Yao and P. Sheldon and E. Vaandering and J. Butler and E. Gottschalk and J. Kowalkowski and M. Votava and J. Appel",

year = "2003",

language = "English (US)",

volume = "2",

pages = "1295--1298",

journal = "IEEE Nuclear Science Symposium Conference Record",

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TY - JOUR

T1 - Real-time embedded system support for the BTeV level 1 muon trigger

AU - Haney, Michael J.

AU - Beauregard, D.

AU - Iyer, R.

AU - Kalbarczyk, Z.

AU - Liu, Q.

AU - Wang, L.

AU - Haney, M.

AU - Selen, M.

AU - Mosse, D.

AU - Shigiltchoff, O.

AU - Chopade, R.

AU - Hovey, L.

AU - Jung, M.

AU - Messie, D.

AU - Oh, J.

AU - Stone, S.

AU - Bapty, T.

AU - Neema, S.

AU - Nordstrom, S.

AU - Shetty, S.

AU - Vashishtha, S.

AU - Yao, D.

AU - Sheldon, P.

AU - Vaandering, E.

AU - Butler, J.

AU - Gottschalk, E.

AU - Kowalkowski, J.

AU - Votava, M.

AU - Appel, J.

PY - 2003

Y1 - 2003

N2 - The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To insure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent multi-university research program for reliable, self-aware, fault adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.

AB - The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To insure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent multi-university research program for reliable, self-aware, fault adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.

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M3 - Conference Article

AN - SCOPUS:19944426382

SN - 1095-7863

VL - 2

SP - 1295

EP - 1298

JO - IEEE Nuclear Science Symposium Conference Record

JF - IEEE Nuclear Science Symposium Conference Record

M1 - N36-65

T2 - 2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference

Y2 - 19 October 2003 through 25 October 2003

ER -

Real-time embedded system support for the BTeV level 1 muon trigger

Abstract

ASJC Scopus subject areas

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