Random test Length with and without Replacement

W. H. Debany, P. K. Varshney, C. R.P. Hartmann

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.

Original languageEnglish (US)
Pages (from-to)1074-1075
Number of pages2
JournalElectronics Letters
Volume22
Issue number20
DOIs
StatePublished - Jan 1 1986
Externally publishedYes

Keywords

  • Detection probability
  • Fault coverage
  • Fault detection
  • Logic and logic design
  • Random patterns
  • Random testing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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