Random test Length with and without Replacement

W. H. Debany; P. K. Varshney; C. R.P. Hartmann

doi:10.1049/el:19860736

Random test Length with and without Replacement

W. H. Debany, P. K. Varshney, C. R.P. Hartmann

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.

Original language	English (US)
Pages (from-to)	1074-1075
Number of pages	2
Journal	Electronics Letters
Volume	22
Issue number	20
DOIs	https://doi.org/10.1049/el:19860736
State	Published - 1986
Externally published	Yes

Keywords

Detection probability
Fault coverage
Fault detection
Logic and logic design
Random patterns
Random testing

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1049/el:19860736

Cite this

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abstract = "We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.",

keywords = "Detection probability, Fault coverage, Fault detection, Logic and logic design, Random patterns, Random testing",

author = "Debany, {W. H.} and Varshney, {P. K.} and Hartmann, {C. R.P.}",

year = "1986",

doi = "10.1049/el:19860736",

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T1 - Random test Length with and without Replacement

AU - Debany, W. H.

AU - Varshney, P. K.

AU - Hartmann, C. R.P.

PY - 1986

Y1 - 1986

N2 - We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.

AB - We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.

KW - Detection probability

KW - Fault coverage

KW - Fault detection

KW - Logic and logic design

KW - Random patterns

KW - Random testing

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JO - Electronics Letters

JF - Electronics Letters

IS - 20

ER -

Random test Length with and without Replacement

Abstract

Keywords

ASJC Scopus subject areas

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