Progress in the noninvasive, in-vivo, tissue modulated Raman spectroscopy of human blood

Joseph Chaiken, W. F. Finney, X. Yang, P. E. Knudson, K. P. Peterson, C. M. Peterson, R. S. Weinstock, D. Hagrman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

We have recently presented the first Raman spectra of in vivo human blood. A brief review of how to obtain such spectra and normalize them to the appropriate blood volume is given showing how to produce spectra that can be used for noninvasive quantitative analysis of blood in vivo. New clinical data from individuals and groups completely reproduce and extend all the earlier results. These new data reveal how certain small differences between individuals result in some variability in their noninvasive quantitation. We show the origin of this variability and how to obtain quantitative corrections based entirely on the individual measurement and tabulated data.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsT. Vo-Dinh, W.S. Grundfest, D.A. Benaron
Pages216-227
Number of pages12
Volume4254
DOIs
StatePublished - 2001
EventBiomedical Diagnostic, Guidance, and Surgical-Assist Systems III - San Jose, CA, United States
Duration: Jan 21 2001Jan 22 2001

Other

OtherBiomedical Diagnostic, Guidance, and Surgical-Assist Systems III
CountryUnited States
CitySan Jose, CA
Period1/21/011/22/01

    Fingerprint

Keywords

  • Blood analysis
  • In vivo Raman spectroscopy
  • Microcirculation
  • Noninvasive

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Chaiken, J., Finney, W. F., Yang, X., Knudson, P. E., Peterson, K. P., Peterson, C. M., Weinstock, R. S., & Hagrman, D. (2001). Progress in the noninvasive, in-vivo, tissue modulated Raman spectroscopy of human blood. In T. Vo-Dinh, W. S. Grundfest, & D. A. Benaron (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4254, pp. 216-227) https://doi.org/10.1117/12.427936