TY - GEN
T1 - Outage Probability Analysis in D2D-Enabled mmWave Cellular Networks with Clustered Users
AU - Turgut, Esma
AU - Gursoy, M. Cenk
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - In this paper, an analytical framework is provided to analyze the uplink performance of device-to-device (D2D)-enabled millimeter wave (mmWave) cellular networks with clustered D2D user equipments (UEs). Locations of cellular UEs are modeled as a Poison Point Process (PPP), while locations of potential D2D UEs are modeled as a Poisson Cluster Process (PCP). Signal-to-interference-plus-noise ratio (SINR) outage probabilities are derived for both cellular and D2D links using tools from stochastic geometry. The distinguishing features of mmWave communications such as directional beamforming and having different path loss laws for line-of-sight (LOS) and non-line-of-sight (NLOS) links are incorporated into the outage analysis by employing a flexible mode selection scheme.
AB - In this paper, an analytical framework is provided to analyze the uplink performance of device-to-device (D2D)-enabled millimeter wave (mmWave) cellular networks with clustered D2D user equipments (UEs). Locations of cellular UEs are modeled as a Poison Point Process (PPP), while locations of potential D2D UEs are modeled as a Poisson Cluster Process (PCP). Signal-to-interference-plus-noise ratio (SINR) outage probabilities are derived for both cellular and D2D links using tools from stochastic geometry. The distinguishing features of mmWave communications such as directional beamforming and having different path loss laws for line-of-sight (LOS) and non-line-of-sight (NLOS) links are incorporated into the outage analysis by employing a flexible mode selection scheme.
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U2 - 10.1109/VTCFall.2018.8690970
DO - 10.1109/VTCFall.2018.8690970
M3 - Conference contribution
AN - SCOPUS:85064888963
T3 - IEEE Vehicular Technology Conference
BT - 2018 IEEE 88th Vehicular Technology Conference, VTC-Fall 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 88th IEEE Vehicular Technology Conference, VTC-Fall 2018
Y2 - 27 August 2018 through 30 August 2018
ER -