Optimal choice of FinFET devices for energy minimization in deeply-scaled technologies

Mohammad Saeed Abrishami; Alireza Shafaei; Yanzhi Wang; Massoud Pedram

doi:10.1109/ISQED.2015.7085431

Optimal choice of FinFET devices for energy minimization in deeply-scaled technologies

Mohammad Saeed Abrishami, Alireza Shafaei, Yanzhi Wang, Massoud Pedram

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

FinFET devices are considered to be the device substitute for bulk CMOS in sub-20nm technology nodes due to the reduced short-channel effects, improved ON/OFF current ratio, and improved voltage scalability. This paper investigates the problem of optimal selection of deeply-scaled FinFET technology to achieve minimum energy consumption for different applications such as sensor applications, smartphones, embedded micro-processors, or server micro-processors, which differ in the required performance and duty ratio. For each application space, different FinFET technologies (with different V_th and gate length biases) are compared in term of minimum energy consumption for both logic circuits and cache memories. A device-circuit-architecture cross-layer framework has been developed to facilitate this technology selection. This optimal technology selection procedure demonstrates up to 11× energy saving compared to poorly selected technologies.

Original language	English (US)
Title of host publication	Proceedings - International Symposium on Quality Electronic Design, ISQED
Publisher	IEEE Computer Society
Pages	234-238
Number of pages	5
Volume	2015-April
ISBN (Print)	9781479975815
DOIs	https://doi.org/10.1109/ISQED.2015.7085431
State	Published - Apr 13 2015
Externally published	Yes
Event	16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States Duration: Mar 2 2015 → Mar 4 2015

Other

Other	16th International Symposium on Quality Electronic Design, ISQED 2015
Country	United States
City	Santa Clara
Period	3/2/15 → 3/4/15

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality

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Optimal choice of FinFET devices for energy minimization in deeply-scaled technologies. / Abrishami, Mohammad Saeed; Shafaei, Alireza; Wang, Yanzhi; Pedram, Massoud.

Proceedings - International Symposium on Quality Electronic Design, ISQED. Vol. 2015-April IEEE Computer Society, 2015. p. 234-238 7085431.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abrishami, MS, Shafaei, A, Wang, Y & Pedram, M 2015, Optimal choice of FinFET devices for energy minimization in deeply-scaled technologies. in Proceedings - International Symposium on Quality Electronic Design, ISQED. vol. 2015-April, 7085431, IEEE Computer Society, pp. 234-238, 16th International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, United States, 3/2/15. https://doi.org/10.1109/ISQED.2015.7085431

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