New test methods for determining fracture toughness as a function of mode mix for bimaterial interfaces

Viswanathan Sundararaman, Barry D. Davidson

Research output: Contribution to conferencePaperpeer-review

13 Scopus citations

Abstract

Three new tests are described that can be used to determine the fracture toughness of bimaterial interfaces over a wide range of mode mixities. They consist of the unsymmetric double cantilever beam (UDCB), the single leg bending (SLB) and the unsymmetric end-notched flexure (UENF) test. Common specimen geometries for all three tests are comprised of long slender beams of dissimilar materials partially joined together along their lengths. The loading and boundary conditions for the UDCB are identical to those of the standard double cantilever beam test. However, as a result of the dissimilar deformations of the two materials, the UDCB test will generally display geometrically nonlinear behavior. Both the SLB and UENF are three point bending tests with the crack tip midway between the center loading pin and one of the side supports. In the UENF specimen, the support at the cracked end transfers load into both cracked regions, whereas the material in the lower cracked region of the SLB specimen is trimmed, forcing the upper material to carry the entire reaction load. The energy release rate and mode mix for each test is determined as a function of the load and geometrical and material properties using an analytical crack tip element analysis, and the accuracy of this analysis is verified by comparison to finite element results. It is shown that, for most bimaterial samples, a complete range of mode mixities can be achieved through the use of the three tests.

Original languageEnglish (US)
Pages141-154
Number of pages14
StatePublished - 1995
EventProceedings of the 1995 ASME International Mechanical Engineering Congress and Exposition - San Francisco, CA, USA
Duration: Nov 12 1995Nov 17 1995

Other

OtherProceedings of the 1995 ASME International Mechanical Engineering Congress and Exposition
CitySan Francisco, CA, USA
Period11/12/9511/17/95

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Mechanical Engineering

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