Abstract
This paper describes a full-wave analysis of MICs in a multilayer dielectric media in a rectangular waveguide. The analysis combines the Spectral Domain approach with residue theory and the contour integration method to accurately evaluate the impedance matrix of the method of moments.
Original language | English (US) |
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Title of host publication | IEEE MTT-S International Microwave Symposium Digest |
Editors | G.A. Koepf |
Publisher | IEEE Computer Society |
Pages | 1535-1538 |
Number of pages | 4 |
Volume | 3 |
State | Published - 1997 |
Event | Proceedings of the 1997 IEEE MTT-S International Microwave Symposium. Part 1 (of 3) - Denver, CO, USA Duration: Jun 8 1997 → Jun 13 1997 |
Other
Other | Proceedings of the 1997 IEEE MTT-S International Microwave Symposium. Part 1 (of 3) |
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City | Denver, CO, USA |
Period | 6/8/97 → 6/13/97 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics