Microwave interferometer for shock wave induced displacement measurement

J. Choi, G. Youssef, S. Breugnot, V. Gupta, T. Itoh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A K-band microwave interferometer for detecting shock wave induced displacement is demonstrated. Target displacement by laser induced shock wave has been widely used for material characterization and adhesive bond testing. In optical interferometers, the surface displacement related to the interface stress is measured by counting the number of fringes which requires additional postprocessing steps. The longer wavelength of a microwave interferometer allows direct reading of the surface displacement. Detection of the shock wave induced displacement on a plastic target is measured using a microwave interferometer then the measured results are compared to the standard optical interferometer results. The advantage of using a microwave-based system is discussed and possible application is demonstrated.

Original languageEnglish (US)
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
Pages1722-1726
Number of pages5
DOIs
StatePublished - Nov 10 2011
Event37th Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE - San Diego, CA, United States
Duration: Jul 18 2010Jul 23 2010

Publication series

NameAIP Conference Proceedings
Volume1335
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other37th Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE
CountryUnited States
CitySan Diego, CA
Period7/18/107/23/10

Keywords

  • Laser Generated Shock Wave
  • Microwave Interferometer
  • Noncontact
  • Nondestructive
  • Shock Wave

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Choi, J., Youssef, G., Breugnot, S., Gupta, V., & Itoh, T. (2011). Microwave interferometer for shock wave induced displacement measurement. In Review of Progress in Quantitative Nondestructive Evaluation (pp. 1722-1726). (AIP Conference Proceedings; Vol. 1335). https://doi.org/10.1063/1.3592136