Measuring radiation of small electronic equipment in three-dimensional TEM cells

M. Klingler, V. Deniau, S. Egot, B. Demoulin, T. Sarkar

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

Three-dimensional TEM cells are starting to be used for EMC immunity testing and radiation measurements. In the second case, these new test facilities offer the advantage of not having to place the equipment under test in different positions to obtain its total radiated power or its far-field radiation pattern. After a brief overview of the general concept of 3D-TEM cells followed by a summary on radiation measurements in TEM and GTEM cells, the second part of this paper presents the practical application of radiation measurements of an off-the-shelf electronic equipment using an industrial prototype of a 6-plate 3D-TEM cell. The results are then compared to reference results obtained of a conventional symmetrical TEM cell. This paper concludes on the repeatability and reproducibility results obtained and the possibilities of measuring radiation from very small items such as electronic components.

Original languageEnglish (US)
Pages21-24
Number of pages4
StatePublished - Dec 1 2001
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
Duration: Oct 29 2001Oct 31 2001

Other

OtherIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
CountryUnited States
CityCambridge, MA
Period10/29/0110/31/01

ASJC Scopus subject areas

  • Engineering(all)

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