Light trapping in thin film silicon solar cells: An assessment

Hui Zhao, Eric Allan Schiff, L. Sivec, J. Yang, S. Guha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an approach to estimating the light-trapping of thin film silicon solar cells by comparing the measured quantum efficiency spectrum and the theoretical absorptance spectrum based on ideal diffractive light scattering. The ideal diffractive absorptance enhancement is about 50 in silicon-based cells. We have surveyed published results for many nanocrystalline silicon cells; the largest empirical enhancement is about 25. We discuss the physical mechanisms leading to the reduced quantum efficiencies.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8110
DOIs
StatePublished - 2011
EventThin Film Solar Technology III - San Diego, CA, United States
Duration: Aug 21 2011Aug 22 2011

Other

OtherThin Film Solar Technology III
CountryUnited States
CitySan Diego, CA
Period8/21/118/22/11

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Keywords

  • Light trapping
  • Nanocrystalline silicon
  • Solar cell
  • Thin film

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Zhao, H., Schiff, E. A., Sivec, L., Yang, J., & Guha, S. (2011). Light trapping in thin film silicon solar cells: An assessment. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8110). [81100E] https://doi.org/10.1117/12.893619