Light trapping in thin film silicon solar cells: An assessment

Hui Zhao, E. A. Schiff, L. Sivec, J. Yang, S. Guha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an approach to estimating the light-trapping of thin film silicon solar cells by comparing the measured quantum efficiency spectrum and the theoretical absorptance spectrum based on ideal diffractive light scattering. The ideal diffractive absorptance enhancement is about 50 in silicon-based cells. We have surveyed published results for many nanocrystalline silicon cells; the largest empirical enhancement is about 25. We discuss the physical mechanisms leading to the reduced quantum efficiencies.

Original languageEnglish (US)
Title of host publicationThin Film Solar Technology III
DOIs
StatePublished - Oct 19 2011
EventThin Film Solar Technology III - San Diego, CA, United States
Duration: Aug 21 2011Aug 22 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8110
ISSN (Print)0277-786X

Other

OtherThin Film Solar Technology III
CountryUnited States
CitySan Diego, CA
Period8/21/118/22/11

Keywords

  • Light trapping
  • Nanocrystalline silicon
  • Solar cell
  • Thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Zhao, H., Schiff, E. A., Sivec, L., Yang, J., & Guha, S. (2011). Light trapping in thin film silicon solar cells: An assessment. In Thin Film Solar Technology III [81100E] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8110). https://doi.org/10.1117/12.893619