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Lifetime regime in the electrically-detected transient grating method applied to amorphous and microcrystalline silicon films
P. Sanguino, M. Niehus, S. Koynov, P. Brogueira, R. Schwarz, J. P. Conde, V. Chu, E. A. Schiff
Research output: Contribution to journal › Conference Article › peer-review
1
Scopus
citations