Joint sizing and adaptive independent gate control for FinFET circuits operating in multiple voltage regimes using the logical effort method

Xue Lin, Yanzhi Wang, Massoud Pedram

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

29 Scopus citations

Fingerprint

Dive into the research topics of 'Joint sizing and adaptive independent gate control for FinFET circuits operating in multiple voltage regimes using the logical effort method'. Together they form a unique fingerprint.

Engineering & Materials Science