Growth and microstructural properties of cadmium telluride thin films

T. C. Kuo, P. Ghosh, P. Kornreich, J. Beasock

Research output: Contribution to journalArticlepeer-review

Abstract

For many applications, such as IR detectors and high speed devices, we need high quality cadmium telluride (CdTe) films. To fabricate CdTe epitaxial films we are using a home-built closed hot wall epitaxy system. In this paper, we shall report the complex nature of the CdTe film's microstructure as grown on InSb substrates. Films were grown under various preparation conditions. We observe profound effects of substrate temperature and source temperature on the microstructure of CdTe films. This study together with other properties will allow us to correlate various effects and to design an optimum preparation condition for epitaxial CdTe thin films. An epitaxial CdTe film on different substrates is a solution to the presentshortage of large area CdTe substrates.

Original languageEnglish (US)
Pages (from-to)220-226
Number of pages7
JournalThin Solid Films
Volume193-194
Issue numberPART 1
DOIs
StatePublished - 1990

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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