Fundamental transport mechanisms and high field mobility measurements in amorphous silicon

Qing Gu; E. A. Schiff; J. B. Chevrier; B. Equer

doi:10.1016/0022-3093(95)00680-X

Fundamental transport mechanisms and high field mobility measurements in amorphous silicon

Qing Gu, E. A. Schiff, J. B. Chevrier, B. Equer

Department of Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Models for high field effects observed in electron drift mobility measurements on hydrogenated amorphous silicon (a-Si:H) are discussed. In particular we describe the two high-field generalizations of the bandtail multiple-trapping model (effective temperatures, and an electric field dependent emission prefactor), and we discuss the origin of these phenomenological models in hopping and mobility-edge models for transport.

Original language	English (US)
Pages (from-to)	194-197
Number of pages	4
Journal	Journal of Non-Crystalline Solids
Volume	198-200
Issue number	PART 1
DOIs	https://doi.org/10.1016/0022-3093(95)00680-X
State	Published - May 1996

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Materials Chemistry

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10.1016/0022-3093(95)00680-X

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@article{9db7a04f51514b4baf753e68b21c2508,

title = "Fundamental transport mechanisms and high field mobility measurements in amorphous silicon",

abstract = "Models for high field effects observed in electron drift mobility measurements on hydrogenated amorphous silicon (a-Si:H) are discussed. In particular we describe the two high-field generalizations of the bandtail multiple-trapping model (effective temperatures, and an electric field dependent emission prefactor), and we discuss the origin of these phenomenological models in hopping and mobility-edge models for transport.",

author = "Qing Gu and Schiff, {E. A.} and Chevrier, {J. B.} and B. Equer",

note = "Funding Information: This research was supported Renewable Energy Laboratory and by the Centre Nationale tifique de France.",

year = "1996",

month = may,

doi = "10.1016/0022-3093(95)00680-X",

language = "English (US)",

volume = "198-200",

pages = "194--197",

journal = "Journal of Non-Crystalline Solids",

issn = "0022-3093",

publisher = "Elsevier",

number = "PART 1",

}

TY - JOUR

T1 - Fundamental transport mechanisms and high field mobility measurements in amorphous silicon

AU - Gu, Qing

AU - Schiff, E. A.

AU - Chevrier, J. B.

AU - Equer, B.

N1 - Funding Information: This research was supported Renewable Energy Laboratory and by the Centre Nationale tifique de France.

PY - 1996/5

Y1 - 1996/5

N2 - Models for high field effects observed in electron drift mobility measurements on hydrogenated amorphous silicon (a-Si:H) are discussed. In particular we describe the two high-field generalizations of the bandtail multiple-trapping model (effective temperatures, and an electric field dependent emission prefactor), and we discuss the origin of these phenomenological models in hopping and mobility-edge models for transport.

AB - Models for high field effects observed in electron drift mobility measurements on hydrogenated amorphous silicon (a-Si:H) are discussed. In particular we describe the two high-field generalizations of the bandtail multiple-trapping model (effective temperatures, and an electric field dependent emission prefactor), and we discuss the origin of these phenomenological models in hopping and mobility-edge models for transport.

UR - http://www.scopus.com/inward/record.url?scp=0030563443&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030563443&partnerID=8YFLogxK

U2 - 10.1016/0022-3093(95)00680-X

DO - 10.1016/0022-3093(95)00680-X

M3 - Article

AN - SCOPUS:0030563443

SN - 0022-3093

VL - 198-200

SP - 194

EP - 197

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

IS - PART 1

ER -

Fundamental transport mechanisms and high field mobility measurements in amorphous silicon

Abstract

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