Abstract
Conventional methods for the analysis of dielectric resonators utilize the mode-matching technique. Other methods have also been used. However, most of the analysis exist for analysis of single resonators. However, for practical dielectric resonators (when more than one loaded cavity is used) there may be apertures coupling one resonator to the other. In addition there may be probes coupling one resonator to the other to carry out response shaping or even cancel out the effects of the higher order modes. Also, probes may be utilized to couple energy into and out of the resonators. The high dielectric constant resonator is generally placed on top of a low dielectric constant material for support. Hence an effective analysis modeling is necessary which will predict the actual experimental data accurately if the appropriate material properties are correctly specified for coupled multiple dielectric resonators. This includes analysis of dielectric resonators with aperture couplings along with probe feeds.
| Original language | English (US) |
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| Title of host publication | IEEE MTT-S International Microwave Symposium Digest |
| Publisher | IEEE Computer Society |
| Pages | 167-170 |
| Number of pages | 4 |
| Volume | 1 |
| State | Published - 1999 |
| Event | Proceedings of the 1999 IEEE MTT-S International Microwave Symposium Digest 'The Magic Touch of Microwaves' - Anaheim, CA, USA Duration: Jun 13 1999 → Jun 19 1999 |
Other
| Other | Proceedings of the 1999 IEEE MTT-S International Microwave Symposium Digest 'The Magic Touch of Microwaves' |
|---|---|
| City | Anaheim, CA, USA |
| Period | 6/13/99 → 6/19/99 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics