Abstract
This paper discusses the characterization of Microwave Integrated Circuits (MICs) in a multilayer dielectric media using Scattering matrix, when either a voltage gap generator or traveling wave impressed currents are used. Modifications on the latter are introduced. Both methods are compared from a physical point of view, analytical complexity, and numerical efficiency.
| Original language | English (US) |
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| Pages | 440-444 |
| Number of pages | 5 |
| State | Published - 1999 |
| Event | 1999 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings - Rio de Janeiro, Braz Duration: Aug 9 1999 → Aug 12 1999 |
Other
| Other | 1999 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings |
|---|---|
| City | Rio de Janeiro, Braz |
| Period | 8/9/99 → 8/12/99 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering