Examination of tungsten oxide based thin films for optical memory

Rebecca Bussjager; Joseph Osman; Joseph Chaiken; Mark Getbehead; Daniel Hinkel; Thomas McEwen

Examination of tungsten oxide based thin films for optical memory

Rebecca Bussjager, Joseph Osman, Joseph Chaiken, Mark Getbehead, Daniel Hinkel, Thomas McEwen

Research output: Contribution to journal › Conference Article › peer-review

Abstract

Data can be write and read in spinning disk format using various forms of tungsten oxide as the media. Using thin film modeling and examining reflection curves, contrast ratios can be improved by choosing a wavelength to read that provides the largest change in reflection from the yellow to blue state. The films give a strong contrast ratio in their purest form compared to other media known which makes them good candidate for optical memory media.

Original language	English (US)
Pages (from-to)	249-251
Number of pages	3
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3864
State	Published - 1999
Externally published	Yes
Event	Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA Duration: Jul 12 1999 → Jul 15 1999

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Cite this

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title = "Examination of tungsten oxide based thin films for optical memory",

abstract = "Data can be write and read in spinning disk format using various forms of tungsten oxide as the media. Using thin film modeling and examining reflection curves, contrast ratios can be improved by choosing a wavelength to read that provides the largest change in reflection from the yellow to blue state. The films give a strong contrast ratio in their purest form compared to other media known which makes them good candidate for optical memory media.",

author = "Rebecca Bussjager and Joseph Osman and Joseph Chaiken and Mark Getbehead and Daniel Hinkel and Thomas McEwen",

year = "1999",

language = "English (US)",

volume = "3864",

pages = "249--251",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) ; Conference date: 12-07-1999 Through 15-07-1999",

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T1 - Examination of tungsten oxide based thin films for optical memory

AU - Bussjager, Rebecca

AU - Osman, Joseph

AU - Chaiken, Joseph

AU - Getbehead, Mark

AU - Hinkel, Daniel

AU - McEwen, Thomas

PY - 1999

Y1 - 1999

N2 - Data can be write and read in spinning disk format using various forms of tungsten oxide as the media. Using thin film modeling and examining reflection curves, contrast ratios can be improved by choosing a wavelength to read that provides the largest change in reflection from the yellow to blue state. The films give a strong contrast ratio in their purest form compared to other media known which makes them good candidate for optical memory media.

AB - Data can be write and read in spinning disk format using various forms of tungsten oxide as the media. Using thin film modeling and examining reflection curves, contrast ratios can be improved by choosing a wavelength to read that provides the largest change in reflection from the yellow to blue state. The films give a strong contrast ratio in their purest form compared to other media known which makes them good candidate for optical memory media.

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M3 - Conference Article

AN - SCOPUS:0033338191

SN - 0277-786X

VL - 3864

SP - 249

EP - 251

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99)

Y2 - 12 July 1999 through 15 July 1999

ER -

Examination of tungsten oxide based thin films for optical memory

Abstract

ASJC Scopus subject areas

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