Examination of tungsten oxide based thin films for optical memory

Rebecca Bussjager, Joseph Osman, Joseph Chaiken, Mark Getbehead, Daniel Hinkel, Thomas McEwen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Data can be write and read in spinning disk format using various forms of tungsten oxide as the media. Using thin film modeling and examining reflection curves, contrast ratios can be improved by choosing a wavelength to read that provides the largest change in reflection from the yellow to blue state. The films give a strong contrast ratio in their purest form compared to other media known which makes them good candidate for optical memory media.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages249-251
Number of pages3
Volume3864
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA
Duration: Jul 12 1999Jul 15 1999

Other

OtherProceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99)
CityKoloa, HI, USA
Period7/12/997/15/99

Fingerprint

Optical data storage
tungsten oxides
Tungsten
examination
Thin films
Oxides
thin films
Wavelength
metal spinning
format
curves
wavelengths

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Bussjager, R., Osman, J., Chaiken, J., Getbehead, M., Hinkel, D., & McEwen, T. (1999). Examination of tungsten oxide based thin films for optical memory. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3864, pp. 249-251). Society of Photo-Optical Instrumentation Engineers.

Examination of tungsten oxide based thin films for optical memory. / Bussjager, Rebecca; Osman, Joseph; Chaiken, Joseph; Getbehead, Mark; Hinkel, Daniel; McEwen, Thomas.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864 Society of Photo-Optical Instrumentation Engineers, 1999. p. 249-251.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bussjager, R, Osman, J, Chaiken, J, Getbehead, M, Hinkel, D & McEwen, T 1999, Examination of tungsten oxide based thin films for optical memory. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3864, Society of Photo-Optical Instrumentation Engineers, pp. 249-251, Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99), Koloa, HI, USA, 7/12/99.
Bussjager R, Osman J, Chaiken J, Getbehead M, Hinkel D, McEwen T. Examination of tungsten oxide based thin films for optical memory. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864. Society of Photo-Optical Instrumentation Engineers. 1999. p. 249-251
Bussjager, Rebecca ; Osman, Joseph ; Chaiken, Joseph ; Getbehead, Mark ; Hinkel, Daniel ; McEwen, Thomas. / Examination of tungsten oxide based thin films for optical memory. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3864 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 249-251
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