@article{588fc0d1f34e471e9386c9775b853038,
title = "Enhanced superconducting transition temperature in electroplated rhenium",
abstract = "We show that electroplated Re films in multilayers with noble metals such as Cu, Au, and Pd have an enhanced superconducting critical temperature relative to previous methods of preparing Re. The dc resistance and magnetic susceptibility indicate a critical temperature of approximately 6 K. The magnetic response as a function of field at 1.8 K demonstrates type-II superconductivity, with an upper critical field on the order of 2.5 T. Critical current densities greater than 107 A/m2 were measured above liquid-helium temperature. Low-loss at radio frequency was obtained below the critical temperature for multilayers deposited onto resonators made with Cu traces on commercial circuit boards. These electroplated superconducting films can be integrated into a wide range of standard components for low-temperature electronics.",
author = "Pappas, {D. P.} and David, {D. E.} and Lake, {R. E.} and M. Bal and Goldfarb, {R. B.} and Hite, {D. A.} and E. Kim and Ku, {H. S.} and Long, {J. L.} and McRae, {C. R.H.} and Pappas, {L. D.} and A. Roshko and Wen, {J. G.} and Plourde, {B. L.T.} and I. Arslan and X. Wu",
note = "Funding Information: We had helpful discussions with Xingzhong Li, Tom Ohki, Jerry Chow, Gene Hilton, Kyle McKay, and Bahman Sarabi. We thank Paul Blanchard and Chunsheng Tian at EAG Laboratories for preparing samples and measuring TOF-SIMS. This work was supported by the Intelligence Advanced Research Projects Activity (IARPA) LogiQ Program and the NIST Quantum Based Metrology Initiative. The use of the Center for Nanoscale Materials, an Office of Science user facility, was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This work is a contribution of NIST, not subject to copyright. Publisher Copyright: {\textcopyright} 2018 Author(s).",
year = "2018",
month = apr,
day = "30",
doi = "10.1063/1.5027104",
language = "English (US)",
volume = "112",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "18",
}