Energy optimal sizing of FinFET standard cells operating in multiple voltage regimes using adaptive independent gate control

Yue Fu, Yanzhi Wang, Xue Lin, Shahin Nazarian, Massoud Pedram

Research output: Chapter in Book/Entry/PoemConference contribution

Abstract

FinFET has been proposed as an alternative for bulk CMOS in the ultra-low power designs due to its more effective channel control, reduced random dopant fluctuation, higher ON/OFF current ratio, lower energy consumption, etc. The characteristics of FinFETs operating in the sub/near-threshold region are very different from those in the strong-inversion region. This paper introduces an analytical transregional FinFET model with high accuracy in both subthrehold and near-threshold regions. The unique feature of independent gate controls for FinFET devices is exploited for achieving a tradeoff between energy consumption and delay, and balancing the rise and fall times of FinFET gates. This paper proposes an effective design framework of FinFET standard cells based on the adaptive independent gate control method such that they can operate properly at all of subthreshold, near-threshold and super-threshold regions. The optimal voltage for independent gate control is derived so as to achieve equal rise and fall times or minimal energy-delay product at any supply voltage level.

Original languageEnglish (US)
Title of host publicationGLSVLSI 2014 - Proceedings of the 2014 Great Lakes Symposium on VLSI
PublisherAssociation for Computing Machinery
Pages73-74
Number of pages2
ISBN (Print)9781450328166
DOIs
StatePublished - 2014
Externally publishedYes
Event24th Great Lakes Symposium on VLSI, GLSVLSI 2014 - Houston, TX, United States
Duration: May 21 2014May 23 2014

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Other

Other24th Great Lakes Symposium on VLSI, GLSVLSI 2014
Country/TerritoryUnited States
CityHouston, TX
Period5/21/145/23/14

Keywords

  • FinFET
  • independent gate control
  • near-threshold

ASJC Scopus subject areas

  • General Engineering

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