Electron mobility-lifetime product and D° defect density in hydrogenated amorphous silicon

S. P. Hotaling, Homer Antoniadis, E. A. Schiff

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


The electron deep-trapping mobility lifetime product μτt and spin defect (D°) density Ns in hydrogenated amorphous silicon (a-Si:H) were studied using transient photocharge and electron spin resonance measurements. Three series of specimens were prepared in two different reactor geometries, with and without argon dilution of silane, and for varying substrate temperatures. For several specimens the effects of light soaking were also measured. For two of the series μτt was roughly inversely proportional to the spin density, in agreement with the model that electrons are deep-trapped by D° defects; these series yielded μτtNs ≈ 109cm-1V-1. For a third series of specimens a more rapid decline of μτt with Ns was observed.

Original languageEnglish (US)
Pages (from-to)420-422
Number of pages3
JournalJournal of Non-Crystalline Solids
Issue numberPART 2
StatePublished - Dec 2 1989

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry


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