The authors examine the range of validity of the quasi-TEM approach commonly used when analyzing microstrip-like structures. It is shown that quasi-TEM results can be obtained as the limiting low-frequency case of a more general model where losses in the dielectric and ground plane as well as surface wave phenomena are included. Numerical results obtained by specially tailored algorithms are presented to show how the quasi-static predictions deviate from the exact solution for a given microstrip geometry as the frequency of operation or the substrate parameters are changed.
|Original language||English (US)|
|Title of host publication||Unknown Host Publication Title|
|Editors||Antonio Luque, A.R. Figueiras Vidal, J.M.R. Delgado|
|Publisher||IEEE Computer Society|
|Number of pages||5|
|State||Published - 1985|
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