EFFICIENT CONCURRENT ERROR DETECTION IN PLAS AND ROMS.

Chien Yi Chen, W. Kent Fuchs, Jacob A. Abraham

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Fingerprint

Dive into the research topics of 'EFFICIENT CONCURRENT ERROR DETECTION IN PLAS AND ROMS.'. Together they form a unique fingerprint.

Engineering & Materials Science