TY - GEN
T1 - Detecting malicious defects in 3D printing process using machine learning and image classification
AU - Wu, Mingtao
AU - Phoha, Vir V.
AU - Moon, Young B.
AU - Belman, Amith K.
N1 - Publisher Copyright:
Copyright © 2016 by ASME.
PY - 2016
Y1 - 2016
N2 - 3D printing, or additive manufacturing, is a key technology for future manufacturing systems. However, 3D printing systems have unique vulnerabilities presented by the ability to affect the infill without affecting the exterior. In order to detect malicious infill defects in 3D printing process, this paper proposes the following: 1) investigate malicious defects in the 3D printing process, 2) extract features based on simulated 3D printing process images, and 3) an experiment of image classification with one group of non-defect infill image and the other group of defect infill training image from 3D printing process. The images are captured layer by layer from the top view of software simulation preview. The data extracted from images is input to two machine learning algorithms, Naive Bayes Classifier and J48 Decision Trees. The result shows Naive Bayes Classifier has an accuracy of 85.26% and J48 Decision Trees has an accuracy of 95.51% for classification.
AB - 3D printing, or additive manufacturing, is a key technology for future manufacturing systems. However, 3D printing systems have unique vulnerabilities presented by the ability to affect the infill without affecting the exterior. In order to detect malicious infill defects in 3D printing process, this paper proposes the following: 1) investigate malicious defects in the 3D printing process, 2) extract features based on simulated 3D printing process images, and 3) an experiment of image classification with one group of non-defect infill image and the other group of defect infill training image from 3D printing process. The images are captured layer by layer from the top view of software simulation preview. The data extracted from images is input to two machine learning algorithms, Naive Bayes Classifier and J48 Decision Trees. The result shows Naive Bayes Classifier has an accuracy of 85.26% and J48 Decision Trees has an accuracy of 95.51% for classification.
UR - http://www.scopus.com/inward/record.url?scp=85021629295&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85021629295&partnerID=8YFLogxK
U2 - 10.1115/IMECE201667641
DO - 10.1115/IMECE201667641
M3 - Conference contribution
AN - SCOPUS:85021629295
T3 - ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
BT - Emerging Technologies; Materials
PB - American Society of Mechanical Engineers (ASME)
T2 - ASME 2016 International Mechanical Engineering Congress and Exposition, IMECE 2016
Y2 - 11 November 2016 through 17 November 2016
ER -