Design optimization of sense amplifiers using deeply-scaled FinFET devices

Alireza Shafaei, Yanzhi Wang, Antonio Petraglia, Massoud Pedram

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper presents the design optimization of sense amplifiers made of deeply-scaled (7nm) FinFET devices in order to improve the energy efficiency of cache memories, while robust operation of the sense amplifier under process variations is achieved. To this end, an analytical solution for deriving the minimum voltage difference that can be correctly sensed between the sense amplifier inputs, considering process variations, is presented. Device parameters and transistor sizing of the sense amplifier are then optimized in order to further increase the cache energy efficiency. The optimized sense amplifier design has 2-fold lower input voltage difference compared with the baseline counterpart, which according to the architecture-level simulations, causes 26% reduction in the total energy consumption of an L1 cache memory.

Original languageEnglish (US)
Title of host publicationProceedings - International Symposium on Quality Electronic Design, ISQED
PublisherIEEE Computer Society
Pages280-283
Number of pages4
Volume2015-April
ISBN (Print)9781479975815
DOIs
StatePublished - Apr 13 2015
Externally publishedYes
Event16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States
Duration: Mar 2 2015Mar 4 2015

Other

Other16th International Symposium on Quality Electronic Design, ISQED 2015
CountryUnited States
CitySanta Clara
Period3/2/153/4/15

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Shafaei, A., Wang, Y., Petraglia, A., & Pedram, M. (2015). Design optimization of sense amplifiers using deeply-scaled FinFET devices. In Proceedings - International Symposium on Quality Electronic Design, ISQED (Vol. 2015-April, pp. 280-283). [7085439] IEEE Computer Society. https://doi.org/10.1109/ISQED.2015.7085439