Design of a scanning Josephson junction microscope for submicron-resolution magnetic imaging

B. L.T. Plourde, D. J. Van Harlingen

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We describe a magnetic field scanning instrument designed to extend the spatial resolution of scanning superconducting quantum interference device microscopy into the submicron regime. This instrument, the scanning Josephson junction microscope, scans a single Josephson junction across the surface of a sample, detecting the local magnetic field by the modulation of the junction critical current. By using a submicron junction and a scanning tunneling microscope feedback system to maintain close proximity to the surface, magnetic field sensitivity of 10 μG with a spatial resolution of 0.3 μm should be attainable, opening up new opportunities for imaging vortex configurations and core structure in superconductors and magnetic domains in magnetic materials.

Original languageEnglish (US)
Pages (from-to)4344-4347
Number of pages4
JournalReview of Scientific Instruments
Volume70
Issue number11
DOIs
StatePublished - Nov 1999

ASJC Scopus subject areas

  • Instrumentation

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