Degraded broadcast channel: Secrecy outside of a bounded range

Shaofeng Zou, Yingbin Liang, Lifeng Lai, Shlomo Shitz Shamai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

A three-receiver degraded broadcast channel with secrecy outside of a bounded range is studied, in which the channel quality gradually degrades from receiver 3 to receiver 1. The transmitter has three messages intended for the receivers with receiver 3 decoding all messages, receiver 2 decoding the first two messages, and receiver 1 decoding only the first message. Furthermore, the third message should be kept secure from receiver 1. The discrete memoryless channel is studied and the secrecy capacity region is characterized. The achievable scheme is based on superposition coding and random binning, in which one superposition layer and random binning together provide secrecy. The converse proof is derived based on the insight obtained from the achievable scheme so that manipulations of terms yield tight rate bounds.

Original languageEnglish (US)
Title of host publication2015 IEEE Information Theory Workshop, ITW 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479955268
DOIs
StatePublished - Jun 24 2015
Event2015 IEEE Information Theory Workshop, ITW 2015 - Jerusalem, Israel
Duration: Apr 26 2015May 1 2015

Publication series

Name2015 IEEE Information Theory Workshop, ITW 2015

Other

Other2015 IEEE Information Theory Workshop, ITW 2015
CountryIsrael
CityJerusalem
Period4/26/155/1/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Networks and Communications
  • Information Systems
  • Computational Theory and Mathematics

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  • Cite this

    Zou, S., Liang, Y., Lai, L., & Shitz Shamai, S. (2015). Degraded broadcast channel: Secrecy outside of a bounded range. In 2015 IEEE Information Theory Workshop, ITW 2015 [7133081] (2015 IEEE Information Theory Workshop, ITW 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITW.2015.7133081