Deadline-aware joint optimization of sleep transistor and supply voltage for FinFET based embedded systems

Huimei Cheng, Ji Li, Jeffrey Draper, Shahin Nazarian, Yanzhi Wang

Research output: Chapter in Book/Entry/PoemConference contribution

1 Scopus citations

Abstract

Leakage power consumption has recently become a great concern for modern embedded systems. FinFET technologies, power gating, and near-and super-threshold regimes can significantly reduce the power consumption. However, there lacks a comprehensive analysis of jointly applying the aforementioned power saving techniques. In this paper, we investigate the application of power gating to FinFET circuits operating in near-and super-threshold voltage regimes for embedded system applications. A joint optimization algorithm is proposed to determine the width/length, position and threshold type of the sleep transistor together with the operating voltage constrained to a certain deadline, and with the goal of minimizing energy per operation. Experimental results demonstrate that the proposed algorithm achieves up to 99:9% energy reductions when compared to the near-threshold approach without power gating and 95:3% when compared to deadline-free optimization.

Original languageEnglish (US)
Title of host publicationGLSVLSI 2017 - Proceedings of the Great Lakes Symposium on VLSI 2017
PublisherAssociation for Computing Machinery
Pages427-430
Number of pages4
ISBN (Electronic)9781450349727
DOIs
StatePublished - May 10 2017
Event27th Great Lakes Symposium on VLSI, GLSVLSI 2017 - Banff, Canada
Duration: May 10 2017May 12 2017

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI
VolumePart F127756

Other

Other27th Great Lakes Symposium on VLSI, GLSVLSI 2017
Country/TerritoryCanada
CityBanff
Period5/10/175/12/17

ASJC Scopus subject areas

  • General Engineering

Fingerprint

Dive into the research topics of 'Deadline-aware joint optimization of sleep transistor and supply voltage for FinFET based embedded systems'. Together they form a unique fingerprint.

Cite this