Abstract
Several de-embedding techniques for modeling passive lossless devices operating in the quasi-static mode are presented. The techniques addresses problems related to the characterization of open structures under conditions of radiation occurrence and lossy transmission lines.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE Topical Meeting on Electrical Performance of Electronic Packaging |
| Editors | Anon |
| Publisher | IEEE Computer Society |
| Pages | 173-175 |
| Number of pages | 3 |
| State | Published - 1994 |
| Event | Proceedings of the 3rd Topical Meeting on Electrical Performance of Electronic Packaging - Monterey, CA, USA Duration: Nov 2 1994 → Nov 4 1994 |
Other
| Other | Proceedings of the 3rd Topical Meeting on Electrical Performance of Electronic Packaging |
|---|---|
| City | Monterey, CA, USA |
| Period | 11/2/94 → 11/4/94 |
ASJC Scopus subject areas
- General Engineering