Dangling-bond relaxation and deep-level measurements in hydrogenated amorphous silicon

Howard M. Branz, Eric A. Schiff

Research output: Contribution to journal › Article › peer-review

36 Scopus citations

Fingerprint

Dive into the research topics of 'Dangling-bond relaxation and deep-level measurements in hydrogenated amorphous silicon'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering

Chemistry