Fingerprint
Dive into the research topics of 'CORRELATION BETWEEN EXCESS 1/f NOISE AND GATE LEAKAGE CURRENT IN ION IMPLANTED GaAs MESFET'S ON SEMI-INSULATING SUBSTRATES.'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
CORRELATION BETWEEN EXCESS 1/f NOISE AND GATE LEAKAGE CURRENT IN ION IMPLANTED GaAs MESFET'S ON SEMI-INSULATING SUBSTRATES.
Prasanta K. Ghosh, S. Sriram, Bonggi Kim, Mukunda B. Das
Research output: Contribution to conference › Paper › peer-review