Concurrent error detection in VLSI processor arrays

Chien Yi Roger Chen, Jacob A. Abraham

Research output: Contribution to journalArticle

Abstract

This paper describes a novel technique using residue codes to detect errors (caused by either permanent or transient faults) in numerical systolic arrays concurrently with the normal operation of the system. A careful analysis of errors is used to drastically reduce the number of residue generators and checkers necessary. Undetectable errors are avoided by suitably choosing the modulo size of the residue code and by slightly modifying the implementation of the multipliers in the truncating circuits or applying few residue code checkers to the array. Error propagation in the array is analyzed in detail to ensure that an erroneous result gen-erated by any adder or multiplier will always be detected at the outputs of the arrays. VLSI implementations of dif-ferent kinds of adders and multipliers are analyzed to show that errors due to faults inside a single bit slice will always produce a detectable error at the output of the arrays. The procedure can be applied to all the processor arrays which can be derived from signal flow graphs.

Original languageEnglish (US)
Pages (from-to)205-214
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume826
DOIs
StatePublished - Jan 21 1988
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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