Computational modeling of laser-induced self-organization in nanoscopic metal films for predictive nanomanufacturing

Justin Trice, Ramki Kalyanaraman, Radhakrishna Sureshkumar

Research output: Chapter in Book/Entry/PoemConference contribution

5 Scopus citations

Abstract

Computer models that accurately predict the dynamics of nanoscale self-organization are vital towards knowledge-based nanomanufacturing. Here we present a first principles computational model of laser induced self-organization of thin metallic films (thickness <= 30 nm) into nanoscale patterns which eventually evolve into ordered nanoparticles. The pattern formation is initiated by a thin film hydrodynamic instability and the ensuing length scales are related to the intrinsic materials properties such as surface tension and van der Waal's dispersion forces. We discuss a fully implicit, finite-difference method with adaptive time step and mesh size control for the solution of the nonlinear, fourth-order PDE governing the thin film dynamics. These simulations capture the changing morphology of the film due to the competition between surface tension and van der Waals forces. Simulation results are used to understand the nonlinear amplification of film height perturbations ∼ (KT/γ)1/2, where K, T and γ represent the Boltzmann constant, absolute temperature, and surface tension respectively, leading eventually to film rupture.

Original languageEnglish (US)
Title of host publicationInstrumentation, Metrology, and Standards for Nanomanufacturing
DOIs
StatePublished - 2007
Externally publishedYes
EventInstrumentation, Metrology, and Standards for Nanomanufacturing - San Diego, CA, United States
Duration: Aug 29 2007Aug 30 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6648
ISSN (Print)0277-786X

Other

OtherInstrumentation, Metrology, and Standards for Nanomanufacturing
Country/TerritoryUnited States
CitySan Diego, CA
Period8/29/078/30/07

Keywords

  • Finite-difference
  • Lubrication equation
  • Nanoparticles
  • Process modeling
  • Thin film

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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