@inproceedings{187e27666b534bb4a764678b41f45a79,

title = "Comparison of random test vector generation strategies",

abstract = "Four random test generation strategies are compared to determine their relative effectiveness: equiprobable 0s and 1s; two weighted random pattern generation algorithms; and the maximum output information entropy principle. The test generation strategies are compared at a variety of target fault coverages. Two statistically based metrics are used to evaluate the techniques: a large-sample test of the difference of means and an upper confidence limit. The two weighted random test pattern generation strategies are found to be generally superior to equiprobable 0s and 1s and maximum output entropy. For a given logic circuit, the same technique is not necessarily optimal at every fault coverage.",

author = "Debany, {Warren H.} and Hartmann, {Carlos R.P.} and Varshney, {Pramod K.} and Mehrotra, {Kishan G.}",

year = "1992",

month = dec,

day = "1",

language = "English (US)",

isbn = "0818621575",

series = "1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers",

publisher = "IEEE Computer Society",

pages = "244--247",

booktitle = "1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers",

address = "United States",

note = "1991 IEEE International Conference on Computer-Aided Design - ICCAD-91 ; Conference date: 11-11-1991 Through 14-11-1991",

}