Comparison of random test vector generation strategies

Warren H. Debany, Carlos R.P. Hartmann, Pramod K. Varshney, Kishan G. Mehrotra

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Four random test generation strategies are compared to determine their relative effectiveness: equiprobable 0s and 1s; two weighted random pattern generation algorithms; and the maximum output information entropy principle. The test generation strategies are compared at a variety of target fault coverages. Two statistically based metrics are used to evaluate the techniques: a large-sample test of the difference of means and an upper confidence limit. The two weighted random test pattern generation strategies are found to be generally superior to equiprobable 0s and 1s and maximum output entropy. For a given logic circuit, the same technique is not necessarily optimal at every fault coverage.

Original languageEnglish (US)
Title of host publication1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers
PublisherIEEE Computer Society
Pages244-247
Number of pages4
ISBN (Print)0818621575
StatePublished - Dec 1 1992
Event1991 IEEE International Conference on Computer-Aided Design - ICCAD-91 - Santa Clara, CA, USA
Duration: Nov 11 1991Nov 14 1991

Publication series

Name1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

Other

Other1991 IEEE International Conference on Computer-Aided Design - ICCAD-91
CitySanta Clara, CA, USA
Period11/11/9111/14/91

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Debany, W. H., Hartmann, C. R. P., Varshney, P. K., & Mehrotra, K. G. (1992). Comparison of random test vector generation strategies. In 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers (pp. 244-247). (1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers). IEEE Computer Society.