Comparison among different approaches for the full-wave MOM characterization of open-ended microstrip lines

E. Drake, R. R. Boix, M. Homo, T. K. Sarkar

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The reflection coefficient of an open-ended boxed microstrip line is computed via three different approaches. Two of the approaches are based on the computation of the input impedance at the plane of the excitation, and the third approach is based on the application of the matrix pencil technique. It is shown that the latter approach is more robust and reliable than the former two approaches for the particular problem solved.

Original languageEnglish (US)
Pages (from-to)246-248
Number of pages3
JournalMicrowave and Optical Technology Letters
Volume21
Issue number4
DOIs
StatePublished - May 20 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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