Collection understanding

Michelle Chang; John J. Leggett; Richard Furuta; Andruid Kerne; J. Patrick Williams; Samuel A. Burns; Randolph G. Bias

doi:10.1145/996350.996426

Collection understanding

Michelle Chang, John J. Leggett, Richard Furuta, Andruid Kerne, J. Patrick Williams, Samuel A. Burns, Randolph G. Bias

Syracuse University Libraries

Research output: Contribution to conference › Other › peer-review

Original language	English (US)
Pages	334
DOIs	https://doi.org/10.1145/996350.996426
State	Published - 2004
Event	the 2004 joint ACM/IEEE conference - Tuscon, AZ, USA Duration: Jun 7 2004 → Jun 11 2004

Conference

Conference	the 2004 joint ACM/IEEE conference
Period	6/7/04 → 6/11/04

Access to Document

10.1145/996350.996426

http://portal.acm.org/citation.cfm?doid=996350.996426

Cite this

@conference{bdf8ae88b94a4342835eb782876fcf12,

title = "Collection understanding",

author = "Michelle Chang and Leggett, {John J.} and Richard Furuta and Andruid Kerne and Williams, {J. Patrick} and Burns, {Samuel A.} and Bias, {Randolph G.}",

year = "2004",

doi = "10.1145/996350.996426",

language = "English (US)",

pages = "334",

note = "the 2004 joint ACM/IEEE conference ; Conference date: 07-06-2004 Through 11-06-2004",

}

TY - CONF

T1 - Collection understanding

AU - Chang, Michelle

AU - Leggett, John J.

AU - Furuta, Richard

AU - Kerne, Andruid

AU - Williams, J. Patrick

AU - Burns, Samuel A.

AU - Bias, Randolph G.

PY - 2004

Y1 - 2004

U2 - 10.1145/996350.996426

DO - 10.1145/996350.996426

M3 - Other

SP - 334

T2 - the 2004 joint ACM/IEEE conference

Y2 - 7 June 2004 through 11 June 2004

ER -