Collection understanding

Michelle Chang, John J. Leggett, Richard Furuta, Andruid Kerne, J. Patrick Williams, Samuel A. Burns, Randolph G. Bias

Research output: Contribution to conferenceOther

Original languageEnglish (US)
StatePublished - 2004
Eventthe 2004 joint ACM/IEEE conference - Tuscon, AZ, USA
Duration: Jun 7 2004Jun 11 2004


Conferencethe 2004 joint ACM/IEEE conference

Cite this

Chang, M., Leggett, J. J., Furuta, R., Kerne, A., Williams, J. P., Burns, S. A., & Bias, R. G. (2004). Collection understanding. 334. the 2004 joint ACM/IEEE conference, .