Collection understanding

Michelle Chang, John J. Leggett, Richard Furuta, Andruid Kerne, J. Patrick Williams, Samuel A. Burns, Randolph G. Bias

Research output: Contribution to conferenceOther

Original languageEnglish (US)
Pages334
DOIs
StatePublished - 2004
Eventthe 2004 joint ACM/IEEE conference - Tuscon, AZ, USA
Duration: Jun 7 2004Jun 11 2004

Conference

Conferencethe 2004 joint ACM/IEEE conference
Period6/7/046/11/04

Cite this

Chang, M., Leggett, J. J., Furuta, R., Kerne, A., Williams, J. P., Burns, S. A., & Bias, R. G. (2004). Collection understanding. 334. the 2004 joint ACM/IEEE conference, . https://doi.org/10.1145/996350.996426