Chemical analysis using scanning force microscopy. An undergraduate laboratory experiment

Mathew M Maye, Jin Luo, Li Han, Chuan Jian Zhong

Research output: Contribution to journalArticle

20 Scopus citations

Abstract

Scanning force microscopy (SFM) was presented as a technique for chemical analysis. SFM provides information on atomic and molecular arrangements besides the capability of chemical mapping. An SFM chemical analysis experiment was conducted, which involved the analysis of tip-sample interaction forces or frictions at self-assembled monolayer surfaces with different functional groups. The technique also allowed the analysis of hydrophobic, electrostatic, van der Waals and hydrogen-bonding interactions between tip and sample which are ideal for stimulating inquiry-based learning activities.

Original languageEnglish (US)
Pages (from-to)207-210
Number of pages4
JournalJournal of Chemical Education
Volume79
Issue number2
StatePublished - Feb 2002
Externally publishedYes

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ASJC Scopus subject areas

  • Chemistry(all)
  • Education

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