Scanning force microscopy (SFM) was presented as a technique for chemical analysis. SFM provides information on atomic and molecular arrangements besides the capability of chemical mapping. An SFM chemical analysis experiment was conducted, which involved the analysis of tip-sample interaction forces or frictions at self-assembled monolayer surfaces with different functional groups. The technique also allowed the analysis of hydrophobic, electrostatic, van der Waals and hydrogen-bonding interactions between tip and sample which are ideal for stimulating inquiry-based learning activities.
|Original language||English (US)|
|Number of pages||4|
|Journal||Journal of Chemical Education|
|State||Published - Feb 2002|
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