Beam test results of the BTeV silicon pixel detector

S. Kwan, J. A. Appel, J. N. Butler, G. Cardoso, H. Cheung, G. Chiodini, D. C. Christian, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, A. Mekkaoui, R. Yarema, S. Zimmermann, C. Newsom, A. Colautti, D. Menasce, S. Sala, R. ColucciaM. Di Corato, M. Artuso, J. C. Wang

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Engineering & Materials Science