Beam test results of the BTeV silicon pixel detector

S. Kwan, J. A. Appel, J. N. Butler, G. Cardoso, H. Cheung, G. Chiodini, D. C. Christian, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, A. Mekkaoui, R. Yarema, S. Zimmermann, C. Newsom, A. Colautti, D. Menasce, S. Sala, R. ColucciaM. Di Corato, M. Artuso, J. C. Wang

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations

Abstract

We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

Original languageEnglish (US)
Pages3/49-3/53
StatePublished - 2000
Event2000 IEEE Nuclear Science Symposium Conference Record - Lyon, France
Duration: Oct 15 2000Oct 20 2000

Other

Other2000 IEEE Nuclear Science Symposium Conference Record
CountryFrance
CityLyon
Period10/15/0010/20/00

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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