Beam test results of the BTeV silicon pixel detector

S. Kwan; J. A. Appel; J. N. Butler; G. Cardoso; H. Cheung; G. Chiodini; D. C. Christian; E. E. Gottschalk; B. K. Hall; J. Hoff; P. A. Kasper; R. Kutschke; A. Mekkaoui; R. Yarema; S. Zimmermann; C. Newsom; A. Colautti; D. Menasce; S. Sala; R. Coluccia; M. Di Corato; M. Artuso; J. C. Wang

Beam test results of the BTeV silicon pixel detector

S. Kwan, J. A. Appel, J. N. Butler, G. Cardoso, H. Cheung, G. Chiodini, D. C. Christian, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, A. Mekkaoui, R. Yarema, S. Zimmermann, C. Newsom, A. Colautti, D. Menasce, S. Sala, R. ColucciaM. Di Corato, M. Artuso, J. C. Wang

Department of Physics

Research output: Contribution to conference › Paper › peer-review

2 Scopus citations

Abstract

We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

Original language	English (US)
Pages	3/49-3/53
State	Published - 2000
Event	2000 IEEE Nuclear Science Symposium Conference Record - Lyon, France Duration: Oct 15 2000 → Oct 20 2000

Other

Other	2000 IEEE Nuclear Science Symposium Conference Record
Country/Territory	France
City	Lyon
Period	10/15/00 → 10/20/00

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

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Kwan, S., Appel, J. A., Butler, J. N., Cardoso, G., Cheung, H., Chiodini, G., Christian, D. C., Gottschalk, E. E., Hall, B. K., Hoff, J., Kasper, P. A., Kutschke, R., Mekkaoui, A., Yarema, R., Zimmermann, S., Newsom, C., Colautti, A., Menasce, D., Sala, S., ... Wang, J. C. (2000). Beam test results of the BTeV silicon pixel detector. 3/49-3/53. Paper presented at 2000 IEEE Nuclear Science Symposium Conference Record, Lyon, France.

Kwan, S, Appel, JA, Butler, JN, Cardoso, G, Cheung, H, Chiodini, G, Christian, DC, Gottschalk, EE, Hall, BK, Hoff, J, Kasper, PA, Kutschke, R, Mekkaoui, A, Yarema, R, Zimmermann, S, Newsom, C, Colautti, A, Menasce, D, Sala, S, Coluccia, R, Di Corato, M, Artuso, M & Wang, JC 2000, 'Beam test results of the BTeV silicon pixel detector', Paper presented at 2000 IEEE Nuclear Science Symposium Conference Record, Lyon, France, 10/15/00 - 10/20/00 pp. 3/49-3/53.

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abstract = "We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.",

author = "S. Kwan and Appel, {J. A.} and Butler, {J. N.} and G. Cardoso and H. Cheung and G. Chiodini and Christian, {D. C.} and Gottschalk, {E. E.} and Hall, {B. K.} and J. Hoff and Kasper, {P. A.} and R. Kutschke and A. Mekkaoui and R. Yarema and S. Zimmermann and C. Newsom and A. Colautti and D. Menasce and S. Sala and R. Coluccia and {Di Corato}, M. and M. Artuso and Wang, {J. C.}",

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language = "English (US)",

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TY - CONF

T1 - Beam test results of the BTeV silicon pixel detector

AU - Kwan, S.

AU - Appel, J. A.

AU - Butler, J. N.

AU - Cardoso, G.

AU - Cheung, H.

AU - Chiodini, G.

AU - Christian, D. C.

AU - Gottschalk, E. E.

AU - Hall, B. K.

AU - Hoff, J.

AU - Kasper, P. A.

AU - Kutschke, R.

AU - Mekkaoui, A.

AU - Yarema, R.

AU - Zimmermann, S.

AU - Newsom, C.

AU - Colautti, A.

AU - Menasce, D.

AU - Sala, S.

AU - Coluccia, R.

AU - Di Corato, M.

AU - Artuso, M.

AU - Wang, J. C.

PY - 2000

Y1 - 2000

N2 - We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

AB - We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

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M3 - Paper

AN - SCOPUS:0034593497

SP - 3/49-3/53

T2 - 2000 IEEE Nuclear Science Symposium Conference Record

Y2 - 15 October 2000 through 20 October 2000

ER -

Beam test results of the BTeV silicon pixel detector

Abstract

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ASJC Scopus subject areas

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