Beam test results of the BTeV silicon pixel detector

S. Kwan, J. A. Appel, J. N. Butler, G. Cardoso, H. Cheung, G. Chiodini, D. C. Christian, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, A. Mekkaoui, R. Yarema, S. Zimmermann, C. Newsom, A. Colautti, D. Menasce, S. Sala, R. Coluccia & 3 others M. Di Corato, Marina Artuso, J. C. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

Original languageEnglish (US)
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference
EditorsD. Merelli, J. Surget, M. Ulma
Volume1
StatePublished - 2000
Event2000 IEEE Nuclear Science Symposium Conference Record - Lyon, France
Duration: Oct 15 2000Oct 20 2000

Other

Other2000 IEEE Nuclear Science Symposium Conference Record
CountryFrance
CityLyon
Period10/15/0010/20/00

Fingerprint

Pixels
Detectors
Silicon
Telescopes
Magnetic fields

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Cite this

Kwan, S., Appel, J. A., Butler, J. N., Cardoso, G., Cheung, H., Chiodini, G., ... Wang, J. C. (2000). Beam test results of the BTeV silicon pixel detector. In D. Merelli, J. Surget, & M. Ulma (Eds.), IEEE Nuclear Science Symposium and Medical Imaging Conference (Vol. 1)

Beam test results of the BTeV silicon pixel detector. / Kwan, S.; Appel, J. A.; Butler, J. N.; Cardoso, G.; Cheung, H.; Chiodini, G.; Christian, D. C.; Gottschalk, E. E.; Hall, B. K.; Hoff, J.; Kasper, P. A.; Kutschke, R.; Mekkaoui, A.; Yarema, R.; Zimmermann, S.; Newsom, C.; Colautti, A.; Menasce, D.; Sala, S.; Coluccia, R.; Di Corato, M.; Artuso, Marina; Wang, J. C.

IEEE Nuclear Science Symposium and Medical Imaging Conference. ed. / D. Merelli; J. Surget; M. Ulma. Vol. 1 2000.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kwan, S, Appel, JA, Butler, JN, Cardoso, G, Cheung, H, Chiodini, G, Christian, DC, Gottschalk, EE, Hall, BK, Hoff, J, Kasper, PA, Kutschke, R, Mekkaoui, A, Yarema, R, Zimmermann, S, Newsom, C, Colautti, A, Menasce, D, Sala, S, Coluccia, R, Di Corato, M, Artuso, M & Wang, JC 2000, Beam test results of the BTeV silicon pixel detector. in D Merelli, J Surget & M Ulma (eds), IEEE Nuclear Science Symposium and Medical Imaging Conference. vol. 1, 2000 IEEE Nuclear Science Symposium Conference Record, Lyon, France, 10/15/00.
Kwan S, Appel JA, Butler JN, Cardoso G, Cheung H, Chiodini G et al. Beam test results of the BTeV silicon pixel detector. In Merelli D, Surget J, Ulma M, editors, IEEE Nuclear Science Symposium and Medical Imaging Conference. Vol. 1. 2000
Kwan, S. ; Appel, J. A. ; Butler, J. N. ; Cardoso, G. ; Cheung, H. ; Chiodini, G. ; Christian, D. C. ; Gottschalk, E. E. ; Hall, B. K. ; Hoff, J. ; Kasper, P. A. ; Kutschke, R. ; Mekkaoui, A. ; Yarema, R. ; Zimmermann, S. ; Newsom, C. ; Colautti, A. ; Menasce, D. ; Sala, S. ; Coluccia, R. ; Di Corato, M. ; Artuso, Marina ; Wang, J. C. / Beam test results of the BTeV silicon pixel detector. IEEE Nuclear Science Symposium and Medical Imaging Conference. editor / D. Merelli ; J. Surget ; M. Ulma. Vol. 1 2000.
@inproceedings{4bc591c850f14d7b96405498b9926842,
title = "Beam test results of the BTeV silicon pixel detector",
abstract = "We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.",
author = "S. Kwan and Appel, {J. A.} and Butler, {J. N.} and G. Cardoso and H. Cheung and G. Chiodini and Christian, {D. C.} and Gottschalk, {E. E.} and Hall, {B. K.} and J. Hoff and Kasper, {P. A.} and R. Kutschke and A. Mekkaoui and R. Yarema and S. Zimmermann and C. Newsom and A. Colautti and D. Menasce and S. Sala and R. Coluccia and {Di Corato}, M. and Marina Artuso and Wang, {J. C.}",
year = "2000",
language = "English (US)",
volume = "1",
editor = "D. Merelli and J. Surget and M. Ulma",
booktitle = "IEEE Nuclear Science Symposium and Medical Imaging Conference",

}

TY - GEN

T1 - Beam test results of the BTeV silicon pixel detector

AU - Kwan, S.

AU - Appel, J. A.

AU - Butler, J. N.

AU - Cardoso, G.

AU - Cheung, H.

AU - Chiodini, G.

AU - Christian, D. C.

AU - Gottschalk, E. E.

AU - Hall, B. K.

AU - Hoff, J.

AU - Kasper, P. A.

AU - Kutschke, R.

AU - Mekkaoui, A.

AU - Yarema, R.

AU - Zimmermann, S.

AU - Newsom, C.

AU - Colautti, A.

AU - Menasce, D.

AU - Sala, S.

AU - Coluccia, R.

AU - Di Corato, M.

AU - Artuso, Marina

AU - Wang, J. C.

PY - 2000

Y1 - 2000

N2 - We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

AB - We report the main results of the BTeV silicon pixel detector beam test carried out at Fermilab during the fixed target run 1999-2000. The tests were performed using a 227 GeV/c pion beam incident on a 6 plane silicon microstrip telescope. Several single-chip silicon pixel planes were placed in the middle of the apparatus. The pixel detector spatial resolution has been studied as a function of track inclination and the number of ADC bits. The effect of an applied external magnetic field was also studied.

UR - http://www.scopus.com/inward/record.url?scp=0034593497&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034593497&partnerID=8YFLogxK

M3 - Conference contribution

VL - 1

BT - IEEE Nuclear Science Symposium and Medical Imaging Conference

A2 - Merelli, D.

A2 - Surget, J.

A2 - Ulma, M.

ER -