Beam test results of the BTeV silicon pixel detector

G. Chiodini, J. A. Appel, M. Artuso, J. N. Butler, G. Cancelo, G. Cardoso, H. Cheung, D. C. Christian, A. Colautti, R. Coluccia, M. Di Corato, E. E. Gottschalk, B. K. Hall, J. Hoff, P. A. Kasper, R. Kutschke, S. W. Kwan, A. Mekkaoui, D. Menasce, C. NewsomS. Sala, R. Yarema, J. C. Wang, S. Zimmermann

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution is studied as a function of track inclination, sensor bias, and readout threshold. The study used a reference silicon telescope to project the incident beam track to the pixel sensor under test.

Original languageEnglish (US)
Pages (from-to)125-130
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume465
Issue number1
DOIs
StatePublished - Jun 1 2001

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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    Chiodini, G., Appel, J. A., Artuso, M., Butler, J. N., Cancelo, G., Cardoso, G., Cheung, H., Christian, D. C., Colautti, A., Coluccia, R., Corato, M. D., Gottschalk, E. E., Hall, B. K., Hoff, J., Kasper, P. A., Kutschke, R., Kwan, S. W., Mekkaoui, A., Menasce, D., ... Zimmermann, S. (2001). Beam test results of the BTeV silicon pixel detector. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 465(1), 125-130. https://doi.org/10.1016/S0168-9002(01)00369-2